METHOD OF ELECTRICALLY BLOWING FUSES UNDER CONTROL OF AN ON-CHIP TESTER INTERFACE APPARATUS

摘要

A chip repair system designed for automated test equipment independent application on many unique very dense ASIC devices in a high turnover environment is disclosed. During test, the system will control on chip built-in self-test (BIST) engines collect and compress repair data, program fuses and finally decompress and reload the repair data for post fuse testing. In end use application this system decompresses and loads the repair data at power-up or at the request of the system.