发明名称 METHOD FOR CORRECTING ASTIGMATISM, METHOD FOR DETERMINING ASTIGMATIC SENSITIVITY AND METHOD FOR EXPOSURE IN CHARGED PARTICLE BEAM ALIGNER
摘要 <p>While shifting the focal point and varying the current values S1 and S2 of two sets of coil in an astigmatism correcting unit, a combination of current values where focal lines (11, 13, 12, 14) having inclinations of 0°, 45°, 90° and 135° with respect to the x axis is determined. A correction sensitivity of astigmatic blur is determined from the combination of current values according to a specified calculation expressions. The correction sensitivity of astigmatic blur can thereby be determined readily in a charged particle beam aligner.</p>
申请公布号 WO2004030056(A1) 申请公布日期 2004.04.08
申请号 WO2003JP11879 申请日期 2003.09.18
申请人 NIKON CORPORATION;SHIMIZU, HIROYASU 发明人 SHIMIZU, HIROYASU
分类号 H01J37/153;(IPC1-7):H01L21/027;G03F7/20;H01J37/305 主分类号 H01J37/153
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