发明名称 HIGH DIELECTRIC CONSTANT THIN FILM AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To solve a problem that reaction in an interface is promoted and mutual diffusion in the interface is promoted when a thin film is prepared on a substrate, such as an Si substrate which is high in reacting property, and as a result, the characteristics of both of the Si substrate and an oxide thin film are deteriorated and the oxide thin film is deposited on the Si substrate whereby it becomes a big trouble upon making the characteristics of a device, which are expected by a composite effect, practicable. SOLUTION: Upon preparing the metallic oxide thin film on the Si substrate, a cyclopentadiene organic metal is employed as a material and the thin film is prepared at the substrate temperature of 400°C or less. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004111644(A) 申请公布日期 2004.04.08
申请号 JP20020272027 申请日期 2002.09.18
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 SHIMIZU TAKASHI
分类号 C23C16/40;H01L21/316;(IPC1-7):H01L21/316 主分类号 C23C16/40
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