| 摘要 |
A device ( 1; 1 a) for the examination of at least one material sample ( 3; 3 a , 3 b , 3 c) which can be inserted into the device ( 1; 1 a) and is irradiated by means of electromagnetic waves ( 4 ), notably X-rays; in the measuring position the material sample ( 3; 3 a , 3 b , 3 c) can be subjected to irradiation by means of the electromagnetic waves ( 4 ) and during a change of sample the beam path ( 4 ) can be interrupted by means of a closure element ( 8 ) which can be moved into the beam path. The device is constructed in such a manner that the closure element ( 8 ) is provided with a reference sample ( 9 ) on its side which faces the rays ( 4 ) in a manner such that a reference measurement can be performed thereon during a change of sample. |
