发明名称 METHOD OF FORMING ULTRA-FINE CONTACT HOLE OF SEMICONDUCTOR DEVICE WITHOUT OVER-HANG
摘要 PURPOSE: A method of forming a contact hole of a semiconductor device is provided to obtain a desired ultra-fine contact hole from a photoresist pattern without over-hang by flowing the photoresist pattern on a solidified intermediate layer using a heat treatment. CONSTITUTION: An intermediate layer with a predetermined thickness is formed on a semiconductor substrate. The intermediate layer is solidified. A photoresist layer is formed on the solidified intermediate layer. A photoresist pattern is formed by exposing and developing the photoresist layer using a contact mask. An ultra-fine contact hole is formed by flowing the photoresist pattern using a heat treatment.
申请公布号 KR100427711(B1) 申请公布日期 2004.04.07
申请号 KR19960047413 申请日期 1996.10.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JIN SU
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
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