发明名称 |
METHOD OF FORMING ULTRA-FINE CONTACT HOLE OF SEMICONDUCTOR DEVICE WITHOUT OVER-HANG |
摘要 |
PURPOSE: A method of forming a contact hole of a semiconductor device is provided to obtain a desired ultra-fine contact hole from a photoresist pattern without over-hang by flowing the photoresist pattern on a solidified intermediate layer using a heat treatment. CONSTITUTION: An intermediate layer with a predetermined thickness is formed on a semiconductor substrate. The intermediate layer is solidified. A photoresist layer is formed on the solidified intermediate layer. A photoresist pattern is formed by exposing and developing the photoresist layer using a contact mask. An ultra-fine contact hole is formed by flowing the photoresist pattern using a heat treatment.
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申请公布号 |
KR100427711(B1) |
申请公布日期 |
2004.04.07 |
申请号 |
KR19960047413 |
申请日期 |
1996.10.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JIN SU |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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