Method and apparatus for detecting defects in a circuit using spectral analysis of transient power supply voltage

摘要

A circuit test method and apparatus uses a spectral characteristic of a supply voltage to detect defects within a device under test (DUT). The spectral characteristic of the supply voltage is preferably measured as the DUT undergoes a predetermined operational sequence. The measured spectral characteristic value is then compared to a predetermined test criterion to determine whether the DUT is likely to include a defect.