发明名称 APPARATUS FOR INSPECTING INSULATION LAYER OF PDP PANEL
摘要 PURPOSE: An apparatus for inspecting insulation layer of PDP panel is provided to inspect a quality or a spreading state of dielectric substance through a large territory by a nondestructive inspection with non-contact probe. CONSTITUTION: An apparatus for inspecting insulation layer of PDP panel comprises a first short bar(50) and a second short bar(55) to apply a standard voltage to all bus electrode of a PDP panel, a capacitance nearing sensor probe(60) for scanning a top part of a dielectric substance formed on the bus electrode in a non-contact method and outputting the change between the bus electrodes according to a change of a dielectric constant and a thickness of the dielectric substance as a voltage value using a capacitance, and a control part(90) for controlling the capacitance nearing sensor probe as well as deciding a state of the dielectric substance by the output voltage of the capacitance nearing sensor probe.
申请公布号 KR20040029194(A) 申请公布日期 2004.04.06
申请号 KR20020058138 申请日期 2002.09.25
申请人 MICROINSPECTION, INC. 发明人 EUN, TAK
分类号 H01J9/42;G01N27/22;G01N27/60;H01J11/12;H01J11/22;H01J11/24;H01J11/26;H01J11/34;H01J11/38;(IPC1-7):H01J17/49 主分类号 H01J9/42
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