发明名称 Method for manufacturing thin film transistor panel
摘要 The present invention provides a method for manufacturing a thin film transistor panel. At first, a gate line is formed on an insulating substrate. A gate insulating layer and a semiconductor layer which comprises an impurity-doped layer are deposited over the gate line sequentially. The semiconductor layer is patterned. A conductive pattern layer with a source electrode, a channel region and a drain electrode is formed over the patterned semiconductor layer. The impurity-doped layer is exposed at the channel region. Then, the impurity-doped layer at the channel region is insulated.
申请公布号 US6716681(B2) 申请公布日期 2004.04.06
申请号 US20020106493 申请日期 2002.03.27
申请人 CHI MEI OPTOELECTRONICS CORP. 发明人 WEN CHUN BIN;TING CHIN LUNG
分类号 H01L21/336;H01L29/786;(IPC1-7):H01L21/00;H01L21/84 主分类号 H01L21/336
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