| 摘要 |
An x-ray diffraction analysis system provides the automated x-ray diffraction analysis of a plurality of samples in a multiple-cell sample holder. The system includes x-ray source, a detector, a movable sample support and a retractable x-ray shield. The retractable shield is movable between a retracted position, in which optical positioning equipment may be used to locate each sample in the proper testing position, and an extended position, in which stray x-ray energy is blocked. The x-ray energy blocked by the shield includes x-rays diffracted from samples closer to the x-ray source than the sample under test, and x-rays from the source directed toward samples further from the source than the sample under test. Automated movement of the sample support and shield allows for an automated routine to sequentially position each sample, move the shield into the extended position and perform the desired analysis.
|
