发明名称 Semiconductor devices and methods for manufacturing semiconductor devices
摘要 A method for manufacturing a semiconductor device that mix mounts non-volatile memories and analog IC's may include the steps of: (a) forming a gate insulation layer 20, a floating gate 22, and a selective oxide insulation layer 24 on a semiconductor substrate 10; (b) forming an insulation layer 12 and a lower electrode 32 that composes a capacitor 300; (d) forming, in a capacitor region 3000, an insulation layer 31 by thermally oxidizing an upper surface section of the lower electrode 32; and (f) forming an intermediate insulation layer 26 and a control gate 23 that form a memory transistor 200, and a dielectric layer 30 and an upper electrode 34 that form the capacitor 300.
申请公布号 US6716694(B2) 申请公布日期 2004.04.06
申请号 US20010947606 申请日期 2001.09.06
申请人 SEIKO EPSON CORPORATION 发明人 YAMADA KENJI
分类号 H01L21/822;H01L21/8247;H01L27/04;H01L27/10;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/822
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