发明名称 DEVICE AND METHOD FOR EXPOSURE
摘要 PROBLEM TO BE SOLVED: To provide an aligner which can perform excellent exposure of high resolution by correcting double rotation symmetrical aberrations of a projection optical system following it simple mechanism. SOLUTION: This aligner is equipped with illumination systems 1 to 15 which illuminates a mask 16, and a projection optical system 18 which projects an image of the pattern of the mask on a substrate 19. Further, the device is equipped with a changing means 4 of changing the polarized state of light illuminating the mask while arranged in the optical system of the lighting systems, and an optical member 18a which is arranged in the optical path of the projection optical system and has a retardation distribution rotationally symmetrical about the optical axis. The optical member is arranged nearby an aperture stop AS or the mask. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004103746(A) 申请公布日期 2004.04.02
申请号 JP20020262182 申请日期 2002.09.09
申请人 NIKON CORP 发明人 MATSUYAMA TOMOYUKI
分类号 G02B5/30;G02B19/00;G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G02B5/30
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