| 摘要 |
PROBLEM TO BE SOLVED: To provide a memory defect treatment device and its method detecting a defect position with respect to a card type memory, and capable of using the memory card irrespective of a defect. SOLUTION: The memory defect treatment device and its method are provided with first steps S70 and S71 of carrying out a functional test to the memory; second steps S72 and S73 of providing no defect information if there is no defect in the memory on the basis of a result, and progressing to a next step if there is a defect; a third step S74 of judging whether a defect free process has been executed with respect to a corresponding block of the memory having the defect when there is a defect; a fourth step S75 of carrying out the defect free process with respect to the defect memory block if the defect free process has not been executed; fifth steps S76 and S77 of providing change information of the memory having the defect if the defect is not serious, and a sixth step S78 of providing retirement information of the memory card if the defect is serious. COPYRIGHT: (C)2004,JPO
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