发明名称 METHOD AND DEVICE FOR INSPECTING THIN SHEET SHAPED COLLOIDAL CRYSTAL ELEMENT
摘要 PROBLEM TO BE SOLVED: To photograph a Kossel pattern and evaluate the quality of a colloidal single-crystal element by solving the following problem: appropriate quality evaluation can not be performed, though development and utilization of colloidal single-crystal elements have been realized rapidly. SOLUTION: The inspection device is so configured as to obtain a transparent Kossel pattern and take this photograph as follows: (1) a transparent solid block, having two flat board surfaces being opposed in parallel, is sandwiched between a colloidal crystal element and a screen, (2) the board surface, facing the screen side of the solid block, is formed into the surface condition of ground glass, (3) a light diffusion sheet and a rough-surfaced sheet are overlapped, and a photograph of a transmitting type Kossel pattern is taken. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004101324(A) 申请公布日期 2004.04.02
申请号 JP20020262457 申请日期 2002.09.09
申请人 NATIONAL INSTITUTE FOR MATERIALS SCIENCE 发明人 SAWADA TSUTOMU;KANAI TOSHIMITSU
分类号 G01M11/00;(IPC1-7):G01M11/00 主分类号 G01M11/00
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