发明名称 PLASMA MONITORING METHOD, PLASMA MONITORING DEVICE AND PLASMA TREATMENT DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma monitoring device which can stably measure with high precision by guaranteeing reproducibility of a measuring position, improving the stability and durability of a probe structure, stabilizing the effect on a plasma, and by improving the S/N characteristics. <P>SOLUTION: The plasma monitoring device is provided with an insulating tube 50 bridged over a chamber 10 across a plasma treatment space, a coaxial cable 52 equipped with a probe with a core wire at the tip exposed and sliding movement freely inserted into the tube from one end of the insulating tube 50, and a measurement circuit 54 for measuring an electromagnetic wave frequency absorbed by electrons in a plasma PZ in the chamber 10 through the coaxial cable 50. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004103264(A) 申请公布日期 2004.04.02
申请号 JP20020259444 申请日期 2002.09.04
申请人 TOKYO ELECTRON LTD 发明人 MATSUMOTO NAOKI;NAKATANI MASAKO;SEGAWA SUMIE;KOSHIMIZU CHISHIO
分类号 H05H1/00;B01J3/02;B01J19/08;C23C16/52;H01L21/3065;H01L21/31;H05H1/46 主分类号 H05H1/00
代理机构 代理人
主权项
地址