发明名称 STAGE POSITION MEASUREMENT AND POSITIONING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To reduce the effect of gas fluctuation and improve measurement accuracy, by eliminating both of positioning error of measurement with an interferometer and an error due to principles of Abbe by position detection sensor using diffraction grating. <P>SOLUTION: The device has stages 1 and 2 having a direct action guiding mechanism, laser interferometers 3a and 3b and two positioning measurement means in the axial direction of position detection sensors 8a, 9a; 8b, 9b, which are less likely to be affected by the variations in the refractivity of gas, as compared with the laser interferometer. For the shift of the target of stage positioning which is indicated by signals of two position measurement means, the position shift indicated by the opto-electric signal of the laser interferometers 3a and 3b is used for positioning control of the low-frequency region, and the position shift indicated by signals of the position detection sensors 8a, 9a; 8b, 9b is used for positioning control of the high-frequency region. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004101362(A) 申请公布日期 2004.04.02
申请号 JP20020263489 申请日期 2002.09.10
申请人 CANON INC 发明人 MATSUMOTO HIDEO
分类号 G01B11/00 主分类号 G01B11/00
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