发明名称 ALIGNING MARK AND METHOD FOR ALIGNING
摘要 PROBLEM TO BE SOLVED: To provide an alignment mark suitable to dispose a plurality of types of alignment marks in a limited area. SOLUTION: The plurality of the alignment marks perform a role of the alignment mark as an first aligning function with the contour, and perform a function of the alignment mark as a second aligning function with the structure in the contour. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004103697(A) 申请公布日期 2004.04.02
申请号 JP20020261172 申请日期 2002.09.06
申请人 SUMITOMO HEAVY IND LTD 发明人 MIYATAKE TSUTOMU
分类号 G01B11/00;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G01B11/00
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