| 摘要 |
PROBLEM TO BE SOLVED: To provide a device and a method for measuring the relative position of a reference position provided on an optical module substrate provided with an optical transmission path, and a beam intensity position. SOLUTION: The optical module substrate measuring device 1 measuring the optical module substrate 10 having the optical transmission path comprises a measuring light emission part 20; a measuring light incident part 22, in which the measuring light emitted from the measuring light emission part 20 is made incident on an end of an optical transmission path; a light-measuring part 30, which receives the measuring light which was made incident on the end of the optical transmission path and emitted from the other end, after propagating through the optical transmission path, and converts it into an electrical signal; a processing part 31 connected with the light-measuring part 30, and receives the electrical signal; and an imaging part 33 connected with the processing part 31, photographs the reference position provided on the optical module substrate, and transmits the signal of the image to an arithmetic part 21. COPYRIGHT: (C)2004,JPO
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