METHOD AND DEVICE FOR DETERMINING THE OPTIMUM INITIAL VALUE IN TEST PATTERN GENERATOR

摘要

PROBLEM TO BE SOLVED: To obtain the optimum initial value input to a test pattern generator for efficiently testing an integrated circuit. SOLUTION: Failure simulation and last-come first-service failure simulation are performed for an arbitrarily given initial value to find the minimum test length, and the next initial value probably obtaining a shorter test length from the obtained minimum test length is calculated to perform failure simulation for the initial value. The next initial value probably obtaining a shorter test length is obtained from the test length of the result to perform failure simulation. By repeating the procedure, the initial value presenting the shortest test length is obtained. COPYRIGHT: (C)2004,JPO