Controlling the content of specific desired memory elements when testing integrated circuits using sequential scanning techniques

摘要

A launch multiplexor which enables a desired bit to be stored into a desired memory element when using sequential scanning techniques (e.g., automatic test pattern generation (ATPG)). The launch multiplexor may be employed in addition to a scan multiplexor, which enables the test pattern bits or normal operating input to be selected and stored in the desired memory element. The scan multiplexor is used to scan-in a test pattern and evaluate a first input, and the launch multiplexor provides the control to store a desired bit into the corresponding memory element. Another output may be evaluated after storing the desired bit. In an embodiment, launch multiplexors are used associated with only memory elements in the critical paths, and the delay in transitioning from one output to another may be conveniently measured.