发明名称 |
METHOD FOR PROCESSING SEMICONDUCTOR SUBSTRATE |
摘要 |
<p>A method for processing a semiconductor substrate comprises a step wherein a trench (16) is formed in the surface of a substrate (W) by etching the substrate (W) and a step wherein a corner portion (10) of the substrate which is at the entrance of the trench (16) is rounded off by heating the substrate (W). The step of rounding off the corner portion (10) includes a first heat treatment conducted in a hydrogen gas atmosphere wherein the process temperature (T) is 850 °C < T < 1050 °C and the process pressure (P) is 0.01 kpa < P < 30 kpa.</p> |
申请公布号 |
WO2004027857(A1) |
申请公布日期 |
2004.04.01 |
申请号 |
WO2003JP11771 |
申请日期 |
2003.09.16 |
申请人 |
TOKYO ELECTRON LIMITED;YONEKAWA, TSUKASA;SUZUKI, KEISUKE |
发明人 |
YONEKAWA, TSUKASA;SUZUKI, KEISUKE |
分类号 |
H01L21/76;H01L21/00;H01L21/762;H01L29/78;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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