发明名称 METHOD FOR PROCESSING SEMICONDUCTOR SUBSTRATE
摘要 <p>A method for processing a semiconductor substrate comprises a step wherein a trench (16) is formed in the surface of a substrate (W) by etching the substrate (W) and a step wherein a corner portion (10) of the substrate which is at the entrance of the trench (16) is rounded off by heating the substrate (W). The step of rounding off the corner portion (10) includes a first heat treatment conducted in a hydrogen gas atmosphere wherein the process temperature (T) is 850 °C &lt; T &lt; 1050 °C and the process pressure (P) is 0.01 kpa &lt; P &lt; 30 kpa.</p>
申请公布号 WO2004027857(A1) 申请公布日期 2004.04.01
申请号 WO2003JP11771 申请日期 2003.09.16
申请人 TOKYO ELECTRON LIMITED;YONEKAWA, TSUKASA;SUZUKI, KEISUKE 发明人 YONEKAWA, TSUKASA;SUZUKI, KEISUKE
分类号 H01L21/76;H01L21/00;H01L21/762;H01L29/78;(IPC1-7):H01L21/76 主分类号 H01L21/76
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