发明名称 FAST GAS EXCHANGE FOR THERMAL CONDUCTIVITY MODULATION
摘要 A method for thermally processing a semiconductor substrate (12) comprises: heating the substrate to a target peak temperature while controlling the gas pressure in the processing chamber (14) at a pressure level that is significantly lower than atmospheric pressure; providing a flow of a purge gas between the substrate and a thermal reservoir (22, 23) at or near the time the substrate temperature reaches the target peak temperature while adjusting the gas pressure in the processing chamber to a second pressure level. Preferably, the purge gas has a relatively high thermal conductivity.
申请公布号 WO2004027838(A2) 申请公布日期 2004.04.01
申请号 WO2003US28510 申请日期 2003.09.09
申请人 APPLIED MATERIALS, INC.;RANISH, JOSEPH;JENNINGS, DEAN;HAAS, BRIAN 发明人 RANISH, JOSEPH;JENNINGS, DEAN;HAAS, BRIAN
分类号 C23C16/44;C23C16/48;F27B17/00;F27D19/00;F27D21/00;H01L21/00;H01L21/324 主分类号 C23C16/44
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