发明名称 Semiconductor device and method of fabricating thereof
摘要 To realize TFT enabling high-speed operation by fabricating a crystalline semiconductor film in which positions and sizes of crystal grains are controlled and using the crystalline semiconductor film in a channel forming region of TFT, a film thickness is stepped by providing a stepped difference in at least one layer of a matrix insulating film among a plurality of matrix insulating films having refractive indices different from each other. By irradiating laser beam from a rear face side of a substrate (or both sides of a surface side and the rear face side of the substrate), there is formed an effective intensity distribution of laser beam with regard to a semiconductor film and there is produced a temperature gradient in correspondence with a shape of the stepped difference and a distribution of the film thickness of the matrix insulating film in the semiconductor film. By utilizing thereof, a location of producing lateral growth and a direction thereof can be controlled to thereby enable to provide crystal grains having large particle sizes.
申请公布号 US2004063258(A1) 申请公布日期 2004.04.01
申请号 US20030678084 申请日期 2003.10.06
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KASAHARA KENJI;KAWASAKI RITSUKO;OHTANI HISASHI
分类号 G02F1/1362;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;(IPC1-7):H01L21/00 主分类号 G02F1/1362
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