发明名称 Process for manufactoring integrated resistive elements with silicidation protection
摘要 <p>Integrated resistors are fabricated by delimiting, in a semiconductor wafer (10), at least one active area; and forming, in the active area, resistive region(s) having a pre-set resistivity. On top of the active area, a delimitation structure is formed for delimiting the resistive region. Protective elements, which extend within the delimitation structure and cover the resistive region, are obtained.</p>
申请公布号 EP1403909(A1) 申请公布日期 2004.03.31
申请号 EP20020425586 申请日期 2002.09.30
申请人 STMICROELECTRONICS S.R.L. 发明人 GROSSI, ALESSANDRO;BEZ, ROBERTO;SERVALLI, GIORGIO
分类号 H01L21/02;H01L27/08;(IPC1-7):H01L21/02 主分类号 H01L21/02
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