发明名称 |
Process for manufacturing semiconductor wafers incorporating differentiated isolating structures |
摘要 |
<p>The process involves opening trenches (8) in a substrate (2) of a semiconductor wafer (1), where the trenches delimit the conductive regions (9). Insulating sidewalls (12) are formed surrounding the trenches (8). Another set of trenches (16) are opened to delimit the conductive regions (17), and the trenches (16) are surrounded by insulating sidewalls (19), where the trenches have different depths. An independent claim is also included for a semiconductor wafer including insulating structures.</p> |
申请公布号 |
EP1403917(A1) |
申请公布日期 |
2004.03.31 |
申请号 |
EP20020425581 |
申请日期 |
2002.09.26 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
BRAZZELLI, DANIELA;CLEMENTI, CESARE |
分类号 |
H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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