发明名称 Mask set for compensating a misalignment between patterns
摘要 The present invention discloses a mask set for compensating for a misalignment between the patterns and method of compensating for a misalignment between the patterns. A mask set of the present invention comprises a first mask consisted of a mask substrate on which a main pattern and a plurality of sub-patterns are formed, said sub-patterns formed at a side of the main pattern; a second mask consisted of a mask substrate on which a plurality of hole patterns are formed, the hole patterns corresponded to spaces between the main pattern and the sub-patterns of the first mask, respectively when the first and second mask are overlapped to each other; and a third mask consisted of mask substrate on which a plurality of bar patterns are formed, the bar patterns corresponded to the hole patterns of the second mask, respectively when the second and third mask are overlapped to each other.
申请公布号 US6713883(B1) 申请公布日期 2004.03.30
申请号 US19970991261 申请日期 1997.12.16
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 HONG SOON WON;YANG TAE HUM
分类号 G03F1/00;H01L23/544;(IPC1-7):H01L23/544 主分类号 G03F1/00
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