发明名称 Warpage measurement system and methods
摘要 A method for measuring the height variability of a stack of materials comprises placing a stack of materials onto a holder that comprises a base and at least two sides extending from the base such that the stack of materials rests on the base and is generally flush with the sides. A distance of a top of the stack of materials relative to a fixed plane is measured at various locations along the top of the stack of materials. The height variability of the stack is determined based on the measurements.
申请公布号 US6711828(B2) 申请公布日期 2004.03.30
申请号 US20010001979 申请日期 2001.12.05
申请人 发明人
分类号 B65H31/00;B65H43/00;G01B5/06;(IPC1-7):G01B5/25 主分类号 B65H31/00
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