发明名称 Semiconductor device and method of manufacturing the same including raised source/drain comprising SiGe or SiC
摘要 SiGe or SiC films are selectively grown on source/drain regions, followed by selectively growing silicon. A monocrystalline film having a high dislocation density or a polycrystalline film can be grown in growing the silicon film by making the C or Ge concentration higher than a predetermined level. The silicon layer on each of the source/drain regions is not monocrystalline or, even if monocrystalline, has a high density of dislocation. Therefore, the silicon film formed thereon is in the form of a monocrystalline silicon film having a high dislocation density or a polycrystalline silicon film. It is possible to suppress an impurity diffusion to reach a deep region caused by channeling of ions generated in the doping step by means of an ion implantation.
申请公布号 US6713359(B1) 申请公布日期 2004.03.30
申请号 US20000564191 申请日期 2000.05.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MIZUSHIMA ICHIRO;SAIDA SHIGEHIKO;FURUHATA TAKEO;TSUNASHIMA YOSHITAKA
分类号 H01L21/265;H01L21/28;H01L21/336;H01L29/417;H01L29/45;H01L29/78;(IPC1-7):H01L21/336;H01L21/320;H01L21/476 主分类号 H01L21/265
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