发明名称 |
DEFORMATION MEASUREMENT METHOD AND DEVICE USING ELECTRONIC SPECKLE INTERFEROMETRY |
摘要 |
PURPOSE: To provide a method and a device used for accurately measuring dynamic deformation, vibration, distortion or the like of an observing object by using an electronic speckle interferometry, and capable of facilitating a phase unlapping process to an extent allowing detection of a connection point of a phase change curve to be automated in executing the phase unlapping process of the phase change curve in a time domain. CONSTITUTION: This method comprises: a step 32 for calculating the cosine component of strength by subtracting the average strength from strength in the time domain of every point of a speckle pattern image; a step 33 for calculating the sine component of the strength by applying a Hilbert transformation process in the time domain to the cosine component; a step 34 for finding the arctangent of a ratio of the calculated cosine component to the calculated sine component to determine an object phase; a step 35 for executing an unlapping calculation process; and a step 36 for outputting three-dimensional deformation distribution data in a displayable form.
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申请公布号 |
KR20040025808(A) |
申请公布日期 |
2004.03.26 |
申请号 |
KR20030008447 |
申请日期 |
2003.02.11 |
申请人 |
PRESIDENT OF SAITAMA UNIVERSITY |
发明人 |
TOYOOKA SATORU;KADONO HIROFUMI |
分类号 |
G01B11/00;G01B9/02;G01B11/16;(IPC1-7):G01B11/00 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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