发明名称 DEFORMATION MEASUREMENT METHOD AND DEVICE USING ELECTRONIC SPECKLE INTERFEROMETRY
摘要 PURPOSE: To provide a method and a device used for accurately measuring dynamic deformation, vibration, distortion or the like of an observing object by using an electronic speckle interferometry, and capable of facilitating a phase unlapping process to an extent allowing detection of a connection point of a phase change curve to be automated in executing the phase unlapping process of the phase change curve in a time domain. CONSTITUTION: This method comprises: a step 32 for calculating the cosine component of strength by subtracting the average strength from strength in the time domain of every point of a speckle pattern image; a step 33 for calculating the sine component of the strength by applying a Hilbert transformation process in the time domain to the cosine component; a step 34 for finding the arctangent of a ratio of the calculated cosine component to the calculated sine component to determine an object phase; a step 35 for executing an unlapping calculation process; and a step 36 for outputting three-dimensional deformation distribution data in a displayable form.
申请公布号 KR20040025808(A) 申请公布日期 2004.03.26
申请号 KR20030008447 申请日期 2003.02.11
申请人 PRESIDENT OF SAITAMA UNIVERSITY 发明人 TOYOOKA SATORU;KADONO HIROFUMI
分类号 G01B11/00;G01B9/02;G01B11/16;(IPC1-7):G01B11/00 主分类号 G01B11/00
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