发明名称 DEFECTIVE LEVEL INFORMATION SETTING METHOD FOR DEFECTIVE CLOTH PIECE DETECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To solve such problems with the setting of a detected limit level value in a defective cloth piece detection device that the accuracy of set values was low since a sample cloth piece was conveyed and the maximum level value of the defect information thereof was set as the limit level value and that a detection operation was troublesome since the sample cloth piece was actually conveyed several times and inspected. SOLUTION: The sample cloth piece is sequentially photographed in line shape while being conveyed, the image of the sample cloth piece is stored, the defect information for each scanning spot in matrix form is displayed on a screen based on the stored image, the image of the sample cloth piece is compared with the image of the matrix of the defect information and the position of a defective part on the matrix is specified, the limit level value of the defective part on the matrix is detected on the screen, and the limit level value is set as defect level information. Thus, the defect information detection operation for the detected defective part can be easily performed, and the limit level value of the detected defective part can be accurately detected. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004093486(A) 申请公布日期 2004.03.25
申请号 JP20020257683 申请日期 2002.09.03
申请人 TOOKAI:KK 发明人 KAGAWA YOSHIKIYO
分类号 G01B11/30;D06H3/08;G01N21/898;(IPC1-7):G01N21/898 主分类号 G01B11/30
代理机构 代理人
主权项
地址