发明名称 Test piece cutter and splitting method thereof
摘要 A precise cutting device for splitting a test piece. The device includes a microscope and a cutter. The microscope has a movable stage and a lens set. The stage supports the test piece. The lens set is adjustable to show the microstructure of the test piece. The cutter disposed under the stage of the microscope can pass through the opening of the stage to form notches on the surface of the test piece.
申请公布号 US2004055433(A1) 申请公布日期 2004.03.25
申请号 US20030648596 申请日期 2003.08.25
申请人 AU OPTRONICS CORP. 发明人 HUANG CHIAO-CHUNG;YU PEI-HSIN;CHUANG YUTING
分类号 B28D1/22;B28D5/00;B28D5/02;C03B33/023;C03B33/027;C03B33/10;C03B33/12;G01N1/04;G01N1/32;(IPC1-7):B26D1/00 主分类号 B28D1/22
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