发明名称 ANALYTICAL APPARATUS
摘要 PROBLEM TO BE SOLVED: To specify arbitrary calibration conditions for each measuring, in a plurality of measurings using an automatic sampler or the like in an analytical apparatus. SOLUTION: In a measuring sequence, that is a sequence of the plurality of measuring conditions, calibration conditions can be set for each measuring condition in the measuring sequence. A measuring head controller sets the calibration condition set in the measuring condition of the measuring to a measuring head, before starting each measuring in the measuring sequence for performing a series of measuring, by controlling the measuring head according to the measuring sequence. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004093267(A) 申请公布日期 2004.03.25
申请号 JP20020253241 申请日期 2002.08.30
申请人 SEIKO INSTRUMENTS INC 发明人 NAGASAWA JUN
分类号 G01N25/20;G01N25/00;G01V13/00;(IPC1-7):G01N25/20 主分类号 G01N25/20
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