发明名称 Method for correcting measurement error, method of determining quality of electronic component, and device for measuring characteristic of electronic component
摘要 The impedance of a correction-data obtaining sample is measured by a standard measuring device and an actual measuring device so as to obtain an interrelated expression of the measurement results generated by the standard and actual measuring devices. The impedance of an electronic component measured by the actual measuring device is substituted into the interrelated expression and the expression is calculated. Accordingly, the impedance of the electronic component is corrected to the impedance which would be obtained from the standard measuring device.
申请公布号 US2004059529(A1) 申请公布日期 2004.03.25
申请号 US20030601718 申请日期 2003.06.23
申请人 MURATA MANUFACTURING CO., LTD. 发明人 KAMITANI GAKU
分类号 G01R35/00;(IPC1-7):G01R27/00 主分类号 G01R35/00
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