发明名称 Current drive circuit avoiding effect of voltage drop caused by load and semiconductor memory device equipped therewith
摘要 A current drive circuit operates receiving higher voltage than in a waiting mode at source terminal of a P-channel first driver transistor, when supplying a current to a node connected to a load circuit. In accordance with the rising source potential of the first driver transistor, the gate potential output to the first driver transistor by a gate potential control circuit rises. When the first and second driver transistors are off, a precharge circuit configured with a P-channel MOS transistor precharges the node to a prescribed potential. As a result, the current drive circuit is provided with increased reliability of the gate insulating films of the driver transistors without decreasing the driving current.
申请公布号 US2004057280(A1) 申请公布日期 2004.03.25
申请号 US20030396414 申请日期 2003.03.26
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OOISHI TSUKASA
分类号 G11C11/15;H01L21/8246;H01L27/105;(IPC1-7):G11C11/00 主分类号 G11C11/15
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