发明名称 III-GROUP NITRIDE SEMICONDUCTOR CRYSTAL, MANUFACTURING METHOD THEREFOR, AND III-GROUP NITRIDE SEMICONDUCTOR EPITAXIAL WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method for a III-group nitride semiconductor crystal whereby the high-quality nitride semiconductor crystal can be formed on a substrate, in a process having a comparably little change in temperature, by utilizing a semiconductor-crystal growing method using the substrate having an irregularly processed surface. <P>SOLUTION: By feeding a III-group raw material to a substrate having an irregularly processed surface while adopting a V/III ratio not larger than 1,000 (inclusive of the case of the V/III ratio being zero), a III-group nitride semiconductor (the III-group nitride semiconductor is represented by InGaAlN) is formed. Thereafter, the vapor-phase epitaxy of a III-group nitride semiconductor crystal is performed by using the III-group raw material and a nitrogen raw material. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004096021(A) 申请公布日期 2004.03.25
申请号 JP20020258344 申请日期 2002.09.04
申请人 SHOWA DENKO KK 发明人 YASUDA TAKENORI;OKUYAMA MINEO
分类号 H01L21/205;H01L33/16;H01L33/22;H01L33/32 主分类号 H01L21/205
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