发明名称 |
PLASMA PROCESSOR AND METHOD OF CALIBRATING MEANS FOR VARIABLE IMPEDANCE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a plasma processor capable of optimally adjusting the condition of a plasma so as to maintain high uniformity of the plasma processing within the surface to be processed in a simple structure. <P>SOLUTION: The plasma processor comprises an upper electrode 6 and a lower electrode 18 which serves as a substrate loading table inside a processing chamber 4 which can be evacuated, wherein a plasma is generated by applying a high-frequency voltage from a high-frequency power source 14 connected to at least one of the upper electrode and the lower electrode via a matching circuit 12 to carry out a prescribed plasma processing to an object W placed on the lower electrode. This plasma processor is furnished with a means 30 for variable impedance interposed in the high-frequency line connected to either one of the electrodes and capable of varying the impedance seen from the other electrode that faces the electrode to which the high-frequency line is connected, and an impedance control unit 32 for controlling the impedance via the means for a variable impedance. <P>COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2004096066(A) |
申请公布日期 |
2004.03.25 |
申请号 |
JP20030060670 |
申请日期 |
2003.03.06 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
YAMAZAWA YOHEI;IWATA MANABU;KOSHIMIZU CHISHIO;HIGUCHI FUMIHIKO;SHIMIZU AKITAKA;YAMASHITA ASAO;IWAMA NOBUHIRO;HIGASHIURA TSUTOMU;ZHANG DONGSHENG;NAKATANI MASAKO;MURAKAMI NORIKAZU |
分类号 |
H05H1/46;B01J3/00;B01J19/08;C23C16/505;H01J37/32;H01L21/00;H01L21/205;H01L21/3065;H05H1/00 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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