发明名称 SINGLE-SIDE POLISHING DEVICE FOR SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing device for preventing polishing unevenness of circular arc shape formed on the outer peripheral part of a substrate after polishing work in a single-side polishing process for polishing the surface of a plate body such as the glass substrate or a wafer. <P>SOLUTION: A back pad 1 formed of a foam sheet made of porous resin is used for the single-side polishing device for polishing the surface of the substrate 2 by pressing the substrate 2 held by the back pad 1, to a rotated polishing machine and abrasive cloth by a pressure lap. In this case, the back pad 1 of 0.4 to 0.8 mm in thickness and 0.2 to 2.8 mg/cm<SP>2</SP>in surface water absorption from the substrate holding face of the back pad 1 is used for polishing work. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004090123(A) 申请公布日期 2004.03.25
申请号 JP20020252622 申请日期 2002.08.30
申请人 CENTRAL GLASS CO LTD 发明人 MARUYAMA MASAKAZU;TSUJII YOSHIAKI
分类号 B24B37/30 主分类号 B24B37/30
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