发明名称 Structure and method of forming bitline contacts for a vertical dram array using a line bitline contact mask
摘要 A bitline contact and method of forming bitline contact for a vertical DRAM array using a bitline contact mask. In the method, gate conductor lines are formed. An oxide layer is deposited over the gate conductor lines, and a bitline contact mask is formed over portions of the oxide layer. The bitline contact mask is etched, and a silicon layer is deposited on the substrate. A bitline layer is deposited on the silicon layer. A masking and etching operation is performed on the bitline layer. A M0 metal is deposited over the silicon layer and on sides of non etched portions of the bitline (M0) layer to form left and right bitlines.
申请公布号 US2004058480(A1) 申请公布日期 2004.03.25
申请号 US20030667308 申请日期 2003.09.23
申请人 NESBIT LARRY A.;FALTERMEIER JOHNATHAN E.;DIVAKARUNI RAMACHANDRA;BERGNER WOLFGANG 发明人 NESBIT LARRY A.;FALTERMEIER JOHNATHAN E.;DIVAKARUNI RAMACHANDRA;BERGNER WOLFGANG
分类号 H01L21/768;H01L21/28;H01L21/60;H01L21/8242;H01L27/108;(IPC1-7):H01L21/82 主分类号 H01L21/768
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