发明名称 |
METHOD FOR MANUFACTURING SPLIT GATE TYPE FLASH MEMORY DEVICE |
摘要 |
PURPOSE: A method for manufacturing a split gate type flash memory device is provided to be capable of forming a floating gate pattern without forming misalignment and approximity effect. CONSTITUTION: A trench isolation layer(58) is formed on a semiconductor substrate for defining a plurality of first active regions(62a) and a plurality of second active regions(62b). Floating gate patterns(64) spaced apart from each other are formed on the first active regions(62a) by etching a conductive pattern using an oxide pattern as a mask. A tunnel oxide layer is formed at both sidewalls of the floating gate patterns(64). A plurality of control gate electrodes are formed on the floating gate patterns.
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申请公布号 |
KR20040025286(A) |
申请公布日期 |
2004.03.24 |
申请号 |
KR20020057191 |
申请日期 |
2002.09.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
MUN, CHANG ROK;YOO, JAE MIN;YOON, JUNG RIM |
分类号 |
H01L21/28;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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