发明名称 WAFER SIDE RINSE APPARATUS OF SEMICONDUCTOR COATING EQUIPMENT
摘要 PURPOSE: A wafer side rinse apparatus of semiconductor coating equipment is provided to prevent an error of a wafer process by using a nozzle detection sensor to sense a bending state of an injection nozzle. CONSTITUTION: A wafer side rinse apparatus of semiconductor coating equipment includes an injection nozzle(6) and a nozzle detection sensor(9). The injection nozzle(6) is used for injecting the rinsing solution. The nozzle detection sensor(9) is installed at both sides of the injection nozzle(6) in order to sense a bending state of the injection nozzle(6). The apparatus for rinsing a side of a wafer in semiconductor coating equipment includes a control unit(8) for stopping an operation when the bending state of the injection nozzle is detected by the nozzle detection sensor(9).
申请公布号 KR20040025075(A) 申请公布日期 2004.03.24
申请号 KR20020056886 申请日期 2002.09.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, YEONG SEOK
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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