发明名称 |
WAFER SIDE RINSE APPARATUS OF SEMICONDUCTOR COATING EQUIPMENT |
摘要 |
PURPOSE: A wafer side rinse apparatus of semiconductor coating equipment is provided to prevent an error of a wafer process by using a nozzle detection sensor to sense a bending state of an injection nozzle. CONSTITUTION: A wafer side rinse apparatus of semiconductor coating equipment includes an injection nozzle(6) and a nozzle detection sensor(9). The injection nozzle(6) is used for injecting the rinsing solution. The nozzle detection sensor(9) is installed at both sides of the injection nozzle(6) in order to sense a bending state of the injection nozzle(6). The apparatus for rinsing a side of a wafer in semiconductor coating equipment includes a control unit(8) for stopping an operation when the bending state of the injection nozzle is detected by the nozzle detection sensor(9).
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申请公布号 |
KR20040025075(A) |
申请公布日期 |
2004.03.24 |
申请号 |
KR20020056886 |
申请日期 |
2002.09.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, YEONG SEOK |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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