发明名称 |
Deformation measuring method and apparatus using electronic speckle pattern interferometry |
摘要 |
<p>A deformation measuring method using electronic speckle pattern interferometry comprises the steps of subtracting an average intensity from the intensity in a time domain at each point of a speckle pattern image so as to compute the cosine component of intensity; subjecting the cosine component to Hilbert transform in a temporal domain so as to compute the sine component of intensity; determining the arctangent of the ratio between thus computed sine and cosine components so as to determine an object phase; carrying out an unwrapping operation; and outputting three-dimensional deformation distribution data in a displayable mode. <IMAGE></p> |
申请公布号 |
EP1400779(A1) |
申请公布日期 |
2004.03.24 |
申请号 |
EP20030002029 |
申请日期 |
2003.01.28 |
申请人 |
PRESIDENT OF SAITAMA UNIVERSITY |
发明人 |
TOYOOKA, SATORU;KADONO, HIROFUMI |
分类号 |
G01B11/00;G01B9/02;G01B11/16;(IPC1-7):G01B11/16 |
主分类号 |
G01B11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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