发明名称 Deformation measuring method and apparatus using electronic speckle pattern interferometry
摘要 <p>A deformation measuring method using electronic speckle pattern interferometry comprises the steps of subtracting an average intensity from the intensity in a time domain at each point of a speckle pattern image so as to compute the cosine component of intensity; subjecting the cosine component to Hilbert transform in a temporal domain so as to compute the sine component of intensity; determining the arctangent of the ratio between thus computed sine and cosine components so as to determine an object phase; carrying out an unwrapping operation; and outputting three-dimensional deformation distribution data in a displayable mode. <IMAGE></p>
申请公布号 EP1400779(A1) 申请公布日期 2004.03.24
申请号 EP20030002029 申请日期 2003.01.28
申请人 PRESIDENT OF SAITAMA UNIVERSITY 发明人 TOYOOKA, SATORU;KADONO, HIROFUMI
分类号 G01B11/00;G01B9/02;G01B11/16;(IPC1-7):G01B11/16 主分类号 G01B11/00
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