发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: To provide a MOS transistor which can reduce gate overlap capacitance while not reducing a drive current thereof. CONSTITUTION: A double-angle smile oxide structure can be obtained by designing a gate electrode 22 to have the curved structure with its side surface spread toward the upper part and by forming a thick end edge portion of a gate oxide film 21 through re-oxidation. The gate overlap capacitance can be reduced while not reducing the drive current by setting impurity concentration of the source/drain layer under the double-angle smile oxidation structure(area surrounding the point B) to the range of 4 x 10¬18cm¬-3±40%.
申请公布号 KR20040025539(A) 申请公布日期 2004.03.24
申请号 KR20030040347 申请日期 2003.06.20
申请人 RENESAS TECHNOLOGY CORP. 发明人 DANG HAI;MAEDA SHIGENOBU;MATSUMOTO TAKUJI;HIRANO YUUICHI
分类号 H01L29/423;H01L21/336;H01L29/45;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L29/423
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