发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: To provide a MOS transistor which can reduce gate overlap capacitance while not reducing a drive current thereof. CONSTITUTION: A double-angle smile oxide structure can be obtained by designing a gate electrode 22 to have the curved structure with its side surface spread toward the upper part and by forming a thick end edge portion of a gate oxide film 21 through re-oxidation. The gate overlap capacitance can be reduced while not reducing the drive current by setting impurity concentration of the source/drain layer under the double-angle smile oxidation structure(area surrounding the point B) to the range of 4 x 10¬18cm¬-3±40%.
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申请公布号 |
KR20040025539(A) |
申请公布日期 |
2004.03.24 |
申请号 |
KR20030040347 |
申请日期 |
2003.06.20 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
DANG HAI;MAEDA SHIGENOBU;MATSUMOTO TAKUJI;HIRANO YUUICHI |
分类号 |
H01L29/423;H01L21/336;H01L29/45;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/423 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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