发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to simplify the process and to reduce the manufacturing cost by simultaneously forming an LDD region and a source/drain region using a single ion-implantation process. CONSTITUTION: A cap oxide layer(202) is formed on a gate(204). An oxide spacer(206) is formed at both sidewalls of the gate. Then, N/P source/drain implantation processing is performed, thereby simultaneously forming an LDD(Lightly Doped Drain) region(210) at the lower portion of the oxide spacer and a source/drain region at the lower portion of the gate.
申请公布号 KR20040025164(A) 申请公布日期 2004.03.24
申请号 KR20020057005 申请日期 2002.09.18
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 LEE, DAE GEUN
分类号 H01L21/335;(IPC1-7):H01L21/335 主分类号 H01L21/335
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