发明名称 Collimation system for dual slice electron beam tomography scanner
摘要 <p>An electron beam (26) tomography (EBT) scanning system (10) comprising an electron source (24) generating an electron beam (26), a target ring (16) that receives the electron beam (26) and emits an x-ray fan beam (38) upon impingement of the electron beam (26) on the target ring (16), a pair of detector arrays (20 and 21) arranged opposite the target ring (16), and a collimator (36) arranged concentrically between the target ring (16) and the pair of detector arrays (20 and 21). The collimator (36) has interior and exterior walls concentrically arranged with one another and surrounding a patient examination area. The interior and exterior walls have a first set of apertures aligned to collimate the x-ray fan beam (38) into a first collimated beam having a first width and a second collimated beam having a second width. Each collimated beam may form a single or double tomographic slice. The collimated beams are detected by the pair of detector arrays (20 and 21).</p>
申请公布号 EP1400983(A2) 申请公布日期 2004.03.24
申请号 EP20030253606 申请日期 2003.06.06
申请人 GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY LLC 发明人 RAND, ROY E.
分类号 G21K1/02;A61B6/03;G21K5/02;(IPC1-7):G21K1/02 主分类号 G21K1/02
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