发明名称 CLEANING APPARATUS AND METHOD OF SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE: A cleaning apparatus and method of a semiconductor substrate are provided to prevent damage of the semiconductor substrate by identifying the alignment of the substrate using a sensor. CONSTITUTION: A cleaning apparatus of a semiconductor substrate includes a bath(200) for loading the semiconductor substrate and a sensor(204) formed on the bath. The sensor(204) compares an unloading image to a loading image and identifies the edge line alignment state of the semiconductor substrate. Preferably, a digital camera is used as the sensor(204).
申请公布号 KR20040024900(A) 申请公布日期 2004.03.24
申请号 KR20020056628 申请日期 2002.09.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KOOG, YEONG CHEOL
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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