发明名称 |
CLEANING APPARATUS AND METHOD OF SEMICONDUCTOR SUBSTRATE |
摘要 |
PURPOSE: A cleaning apparatus and method of a semiconductor substrate are provided to prevent damage of the semiconductor substrate by identifying the alignment of the substrate using a sensor. CONSTITUTION: A cleaning apparatus of a semiconductor substrate includes a bath(200) for loading the semiconductor substrate and a sensor(204) formed on the bath. The sensor(204) compares an unloading image to a loading image and identifies the edge line alignment state of the semiconductor substrate. Preferably, a digital camera is used as the sensor(204).
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申请公布号 |
KR20040024900(A) |
申请公布日期 |
2004.03.24 |
申请号 |
KR20020056628 |
申请日期 |
2002.09.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KOOG, YEONG CHEOL |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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