发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE: To provide a semiconductor device that prevents contact failures in an upper electrode and the occurrence of an area penalty. CONSTITUTION: The semiconductor device comprises lower storage nodes 10a-10d provided on a main surface 1a of a silicon substrate 1; a dielectric film 15 provided on the lower storage nodes 10a-10d; an upper cell plate electrode 11 provided on the dielectric film 15; and an interlayer insulating film 3 for covering the upper cell plate electrode 11. The upper cell plate electrode 11 contains ruthenium. The interlayer insulating film 3 has a contact hole 21a, reaching the upper cell plate electrode 11. The contact hole 21a is provided so that distance from the main surface 1a of the silicon substrate 1 to the bottom surface 21m of the contact hole 21a is set to be at least distance from the main surface 1a of the silicon substrate 1 to the bottom surface 11m of the upper cell plate electrode 11.
申请公布号 KR20040025535(A) 申请公布日期 2004.03.24
申请号 KR20030032022 申请日期 2003.05.20
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TAKEUCHI MASAHIKO;DOKAN TAKASHI
分类号 H01L21/768;H01L21/108;H01L21/8242;H01L27/108;H01L29/76;(IPC1-7):H01L21/108 主分类号 H01L21/768
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