发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: To provide a semiconductor device that prevents contact failures in an upper electrode and the occurrence of an area penalty. CONSTITUTION: The semiconductor device comprises lower storage nodes 10a-10d provided on a main surface 1a of a silicon substrate 1; a dielectric film 15 provided on the lower storage nodes 10a-10d; an upper cell plate electrode 11 provided on the dielectric film 15; and an interlayer insulating film 3 for covering the upper cell plate electrode 11. The upper cell plate electrode 11 contains ruthenium. The interlayer insulating film 3 has a contact hole 21a, reaching the upper cell plate electrode 11. The contact hole 21a is provided so that distance from the main surface 1a of the silicon substrate 1 to the bottom surface 21m of the contact hole 21a is set to be at least distance from the main surface 1a of the silicon substrate 1 to the bottom surface 11m of the upper cell plate electrode 11.
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申请公布号 |
KR20040025535(A) |
申请公布日期 |
2004.03.24 |
申请号 |
KR20030032022 |
申请日期 |
2003.05.20 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
TAKEUCHI MASAHIKO;DOKAN TAKASHI |
分类号 |
H01L21/768;H01L21/108;H01L21/8242;H01L27/108;H01L29/76;(IPC1-7):H01L21/108 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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