发明名称
摘要 In a wafer polishing apparatus 1 according to this invention, waiting units 43 having upper-lower two-stage wafer placement tables each for temporarily keeping a wafer from a load/unload unit 3 to a polishing head 42 or vice versa are provided to a polishing unit 4, and the upper/lower stage wafer placement tables can move individually. A spindle-washing unit 44 for washing polishing heads is disposed inside a lower space below the waiting units.
申请公布号 KR100424285(B1) 申请公布日期 2004.03.24
申请号 KR20010009256 申请日期 2001.02.23
申请人 发明人
分类号 H01L21/304;B24B37/04;B24B41/00;H01L21/00;H01L21/677 主分类号 H01L21/304
代理机构 代理人
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