发明名称 Silylation treatment unit and method
摘要 A silylation treatment unit includes a chamber, a heating mechanism provided in this chamber for heating a substrate, a supplying mechanism for supplying a vapor including a silylation reagent into the chamber. The unit also has a substrate holder for holding the substrate in the chamber, in which an interval between the heating mechanism and the substrate is adjustable to at least three levels or more. The substrate is received such that it is least influenced by a heat in the chamber by maximizing the interval from the heating mechanism. The interval is brought comparatively closer to the heating mechanism to wait until the temperature inside the chamber obtains a high planer uniformity. The interval is brought further closer to the heating mechanism after a high planer uniformity is obtained such that a silylation reaction occurs.
申请公布号 US6709523(B1) 申请公布日期 2004.03.23
申请号 US20000713247 申请日期 2000.11.16
申请人 TOKYO ELECTRON LIMITED 发明人 TOSHIMA TAKAYUKI;OMORI TSUTAE;YAMASHITA MASAMI
分类号 H01L21/205;G03F7/20;G03F7/26;H01L21/00;(IPC1-7):C23C16/00 主分类号 H01L21/205
代理机构 代理人
主权项
地址