发明名称 Method of fabricating semiconductor device
摘要 A method for disposing metal wiring on the surface of an insulating film formed on a semiconductor substrate. A recess is formed in the insulating film, and a metal wiring film composed of a metal wiring material is laminated on the insulating film having the recess formed therein. Further, the metal wiring film laminated on a surface area outside the recess in the insulating film is selectively removed. Thereafter, the metal wiring film laminated above the recess is polished by chemical mechanical polishing.
申请公布号 US6709973(B1) 申请公布日期 2004.03.23
申请号 US19990465397 申请日期 1999.12.17
申请人 ROHM CO., LTD 发明人 SAKAMOTO TATSUYA
分类号 H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/768
代理机构 代理人
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