发明名称 Substrate including wide low-defect region for use in semiconductor element
摘要 In a process for producing a substrate for use in a semiconductor element: a porous anodic alumina film having a great number of minute pores is formed on a surface of a base substrate; the surface of the base substrate is etched by using the porous anodic alumina film as a mask so as to form a great number of pits on the surface of the base substrate; the porous anodic alumina film is removed; and a GaN layer is formed on the surface of the base substrate by crystal growth.
申请公布号 US6709513(B2) 申请公布日期 2004.03.23
申请号 US20020188038 申请日期 2002.07.03
申请人 FUJI PHOTO FILM CO., LTD. 发明人 FUKUNAGA TOSHIAKI;KUNIYASU TOSHIAKI;WADA MITSUGU;HOTTA YOSHINORI
分类号 C30B25/02;C30B25/18;H01L21/20;(IPC1-7):C30B25/04 主分类号 C30B25/02
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