发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH BURIED BIT LINE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device with a buried bit line is provided to be capable of restraining overlay failure between bit line and bit line contact and preventing collapse of the bit line. CONSTITUTION: The first interlayer dielectric(35) is formed on a semiconductor substrate(31). A plurality of plugs(36,37) are formed to connect the substrate through the first interlayer dielectric. The second interlayer dielectric(38) is formed on the resultant structure. A dual damascene pattern(43) including a hole pattern and a line pattern is formed by selectively etching the second interlayer dielectric. A bit line(45) is then buried in the dual damascene pattern.
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申请公布号 |
KR20040024685(A) |
申请公布日期 |
2004.03.22 |
申请号 |
KR20020056104 |
申请日期 |
2002.09.16 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JANG, HEON YONG;KIM, HONG SEON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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