发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH BURIED BIT LINE
摘要 PURPOSE: A method for manufacturing a semiconductor device with a buried bit line is provided to be capable of restraining overlay failure between bit line and bit line contact and preventing collapse of the bit line. CONSTITUTION: The first interlayer dielectric(35) is formed on a semiconductor substrate(31). A plurality of plugs(36,37) are formed to connect the substrate through the first interlayer dielectric. The second interlayer dielectric(38) is formed on the resultant structure. A dual damascene pattern(43) including a hole pattern and a line pattern is formed by selectively etching the second interlayer dielectric. A bit line(45) is then buried in the dual damascene pattern.
申请公布号 KR20040024685(A) 申请公布日期 2004.03.22
申请号 KR20020056104 申请日期 2002.09.16
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JANG, HEON YONG;KIM, HONG SEON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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